A3P250PQG208I

Product Details

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[ ACTEL ]

General Description

ProASIC3, the third-generation family of Actel Flash FPGAs, offers performance, density, and features beyond those of the ProASICPLUS® family. Nonvolatile Flash technology gives ProASIC3 devices the advantage of being a secure, low-power, single-chip solution that is live at power-up (LAPU). ProASIC3 is reprogrammable and offers time-to-market benefits at an ASIC-level unit cost. These features enable designers to create high-density systems using existing ASIC or FPGA design flows and tools.

Features and Benefits

High Capacity
• 30 k to 1 Million System Gates
• Up to 144 kbits of True Dual-Port SRAM
• Up to 300 User I/Os

Reprogrammable Flash Technology

• 130-nm, 7-Layer Metal (6 Copper), Flash-Based CMOS Process
• Live at Power-Up (LAPU) Level 0 Support
• Single-Chip Solution
• Retains Programmed Design when Powered Off

On-Chip User Nonvolatile Memory

• 1 kbit of FlashROM with Synchronous Interfacing

High Performance

• 350 MHz System Performance
• 3.3 V, 66 MHz 64-Bit PCI (except A3P030)

In-System Programming (ISP) and Security

• Secure ISP Using On-Chip 128-Bit Advanced Encryption Standard (AES) Decryption (except A3P030 and ARM®- enabled ProASIC®3 devices) via JTAG (IEEE 1532– compliant)
• FlashLock® to Secure FPGA Contents

Low Power

• Core Voltage for Low Power
• Support for 1.5-V-Only Systems
• Low-Impedance Flash Switches

High-Performance Routing Hierarchy

• Segmented, Hierarchical Routing and Clock Structure
• Ultra-Fast Local and Long-Line Network
• Enhanced High-Speed, Very-Long-Line Network
• High-Performance, Low-Skew Global Network
• Architecture Supports Ultra-High Utilization

Advanced I/O

• 700 Mbps DDR, LVDS-Capable I/Os (A3P250 and above)
• 1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation
• Bank-Selectable I/O Voltages—Up to 4 Banks per Chip
• Single-Ended I/O Standards: LVTTL, LVCMOS 3.3 V / 2.5 V / 1.8 V / 1.5 V, 3.3 V PCI / 3.3 V PCI-X (except A3P030), and LVCMOS 2.5 V / 5.0 V Input
• Differential I/O Standards: LVPECL, LVDS, BLVDS, and M-LVDS (A3P250 and above)
• I/O Registers on Input, Output, and Enable Paths
• Hot-Swappable and Cold Sparing I/Os (A3P030 only)
• Programmable Output Slew Rate (except A3P030) and Drive Strength
• Weak Pull-Up/Down
• IEEE 1149.1 (JTAG) Boundary Scan Test
• Pin-Compatible Packages Across the ProASIC3 Family

Clock Conditioning Circuit (CCC) and PLL (except A3P030)

• Six CCC Blocks, One with an Integrated PLL
• Configurable Phase-Shift, Multiply/Divide, Delay Capabilities and External Feedback, Multiply/Divide, Delay Capabilities, and External Feedback
• Wide Input Frequency Range (1.5 MHz to 350 MHz)
• CoreMP7Sd (with debug) and CoreMP7S (without debug

SRAMs and FIFOs (except A3P030)

• Variable-Aspect-Ratio 4,608-Bit RAM Blocks (×1, ×2, ×4, ×9, and ×18 Organizations Available)
• True Dual-Port SRAM (except ×18)
• 24 SRAM and FIFO Configurations with Synchronous Operation up to 350 MHz

Soft ARM7™ Core Support in M7 ProASIC3 Devices

• CoreMP7Sd (with debug) and CoreMP7S (without debug)